• DocumentCode
    3512755
  • Title

    The detection of DC arc fault: Experimental study and fault recognition

  • Author

    Yao, Xiu ; Herrera, Luis ; Huang, Yi ; Wang, Jin

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH, USA
  • fYear
    2012
  • fDate
    5-9 Feb. 2012
  • Firstpage
    1720
  • Lastpage
    1727
  • Abstract
    DC arc fault introduces major safety concerns in a wide variety of power electronic applications. However, the randomness and instability of dc arc makes it difficult to be detected. In this paper, an experimental system to study the characteristics of series dc arc is designed and different tests were conducted in order to determine the influence of different factors to the arc such as gap length, current, etc. During the experiments, the load current was varied from 6 A to 30 A, and dc source voltage was changed from 75 V to 300 V. Also, dc arc test with fixed power supply voltage and load current but changing gap length were conducted to examine the influence of arc length. Based on the experimental results, a primary V-I characteristics study was carried out. Current variation analysis was performed to investigate the pulse patterns of the arc current for detection purposes. High frequency arc impedance under different test conditions was also investigated. Lastly, time frequency analysis was applied to the different arc current signals in order to examine the impacts of factors such as load current, dc bus input voltage to the arc current with respect to frequency domain. The results of this paper provide insights of the dc arc characteristics as well as methods for dc arc fault detection.
  • Keywords
    arcs (electric); fault diagnosis; power electronics; time-frequency analysis; DC arc test; DC bus input voltage; arc current signal detection; arc length; current 6 A to 30 A; current variation analysis; dc source voltage; fault recognition; frequency domain analysis; gap length; high frequency arc impedance; load current; power electronic applications; power supply voltage; primary V-I characteristic; series DC arc fault detection; series DC arc instability; time frequency analysis; voltage 75 V to 300 V; Circuit faults; Electrodes; Equations; Frequency domain analysis; Impedance; Mathematical model; Resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2012 Twenty-Seventh Annual IEEE
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    978-1-4577-1215-9
  • Electronic_ISBN
    978-1-4577-1214-2
  • Type

    conf

  • DOI
    10.1109/APEC.2012.6166054
  • Filename
    6166054