Software BIT design and testing for embedded software

Author

Wang, Yichen ; Zhou, Zhenzhen

Author_Institution

Dept. of Syst. Eng., Beihang Univ., Beijing, China

fYear

2009

fDate

20-24 July 2009

Firstpage

703

Lastpage

707

Abstract

Build-in-test of software is designed in embedded system widely. This paper analyses the general architecture of the embedded system, introduces three types of BIT structure pattern, for each pattern, the arithmetic design is described in details with real practice. This paper presents a new s/w BIT approach based on fault injection. Four important phrases: testing requirement analysis, fault injection, testing design and result analysis are described thoroughly in this approach. The ending part is the summery of the paper.

Keywords

built-in self test; embedded systems; program testing; BIT structure pattern; arithmetic design; build-in-test; embedded software testing; embedded system; fault injection; software BIT design; testing requirement analysis; Application software; Built-in self-test; Embedded software; Embedded system; Hardware; Pattern analysis; Software algorithms; Software design; Software testing; System testing; embedded software; fault injection; software Build-In-Test; software testability; software testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability, Maintainability and Safety, 2009. ICRMS 2009. 8th International Conference on

Conference_Location

Chengdu

Print_ISBN

978-1-4244-4903-3

Electronic_ISBN

978-1-4244-4905-7

Type

conf

DOI

10.1109/ICRMS.2009.5270099

Filename

5270099