Temperature dependency and dielectric properties of EPDM with void

Author

Kim, Dong-Shick ; Kang, Moo-Seong ; Oh, Jae-Hyung ; Lee, Chang-Hun ; Park, Dae-Hee ; Kim, Yong- Joo

Author_Institution

Sch. of Electr. Eng., Wonkwang Univ., Iksan, Japan

Volume

2

fYear

1997

fDate

25 -30 May 1997

Firstpage

972

Abstract

The dielectric characteristics of EPDM were characterized and the temperature dependency was also evaluated at the constant electric field. While the value of tan δ was 3.55×10^-3(%) and increased with increasing temperature in EPDM without voids, the value of tan δ was lowered to 2.24×10^-3(%) and the temperature influence on tan δ was not shown to be great in the EPDM containing voids. It was shown that the dielectric properties of EPDM was the most influencing factor on the properties of EPDM/semiconductor specimen but the semiconductor layer played only a simple role as an electrode in the specimen

Keywords

dielectric losses; ethylene-propylene rubber; voids (solid); EPDM; dielectric properties; loss angle; semiconductor layer electrode; temperature dependence; void; Aging; Cable insulation; Capacitance; Dielectrics and electrical insulation; Electrodes; Paramagnetic resonance; Rubber; Temperature dependence; Temperature distribution; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Properties and Applications of Dielectric Materials, 1997., Proceedings of the 5th International Conference on

Conference_Location

Seoul

Print_ISBN

0-7803-2651-2

Type

conf

DOI

10.1109/ICPADM.1997.616606

Filename

616606