DocumentCode
3512865
Title
Promoting Robust Design of Diode Lasers for Space: A National Initiative
Author
Tratt, David M. ; Stephen, Mark A. ; Amzajerdian, Farzin ; Shapiro, Andrew A. ; Kashem, Nasir B. ; Mense, Allan T.
Author_Institution
Aerosp. Corp., Pasadena, CA
fYear
2008
fDate
1-8 March 2008
Firstpage
1
Lastpage
9
Abstract
The diode-laser array working group (DAWG) is a national-level consumer/provider forum for discussion of engineering and manufacturing issues which influence the reliability and survivability of high-power broad-area laser diode devices in space, with an emphasis on laser diode arrays (LDAs) for optical pumping of solid-state laser media. The goals of the group are to formulate and validate standardized test and qualification protocols, operational control recommendations, and consensus manufacturing and certification standards. Reliability and lifetime data collected by laser diode manufacturers and the user community are being used to develop standardized guidelines for specifying and qualifying laser diodes for long-duration operation in space. Effective implementation of statistical design techniques at the supplier design, development, and manufacturing levels will aid in reducing product performance variability and improve product reliability for diodes employed in space applications. The ultimate goal is to promote an informed U.S. Government investment and procurement strategy for assuring the availability and durability of space-qualified LDAs.
Keywords
design of experiments; optical pumping; reliability; semiconductor laser arrays; space vehicle electronics; certification standards; consensus manufacturing; diode-laser array working group; high-power broad-area laser diode devices; operational control recommendations; optical pumping; product reliability; qualification protocols; robust design; solid-state laser media; space applications; statistical design techniques; Diode lasers; Linear discriminant analysis; Manufacturing; Optical arrays; Optical design; Optical pumping; Reliability engineering; Robustness; Semiconductor laser arrays; Solid lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Aerospace Conference, 2008 IEEE
Conference_Location
Big Sky, MT
ISSN
1095-323X
Print_ISBN
978-1-4244-1487-1
Electronic_ISBN
1095-323X
Type
conf
DOI
10.1109/AERO.2008.4526380
Filename
4526380
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