DocumentCode
3512905
Title
Tunable Leaky-Mode MEMS Filters for Multispectral Imaging Applications
Author
Magnusson, Robert ; Shokooh-Saremi, Mehrdad
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Connecticut, Storrs, CT
fYear
2008
fDate
1-8 March 2008
Firstpage
1
Lastpage
7
Abstract
When an incident electromagnetic wave is properly coupled to a waveguide´s leaky eigenmode by a subwavelength grating, a guided-mode resonance takes place. This phenomenon can manifest itself as sharp, high quality resonances in the reflection spectra. Since these resonances are highly sensitive to the device structural parameters (-grating thickness, period, and filling factor), a tunable resonance can be implemented if one or more of these parameters are suitably varied. In this paper, the micro-electro-mechanical system (MEMS) concept is applied for tuning the spectral response of resonant filters through mechanical microscale alteration of the grating profile. We provide numerical solutions based on exact electromagnetic models of MEMS-tuned resonance gratings designed with common materials. Computed results for an example tunable element with 6.0 mum period and 2.4 mum thickness show MEMS tuning of ~3.4 mum in the -9-12 mum band with -100 nm resonance linewidth. These elements are promising candidates for MWIR (3-8 mum) and LWIR (8-15 mum) multispectral imaging applications.
Keywords
electromagnetic waves; filtering theory; geophysical signal processing; micromechanical devices; resonance; waveguides; LWIR; MWIR; guided-mode resonance; incident electromagnetic wave; leaky eigenmode; mechanical microscale alteration; micro-electro-mechanical system concept; multispectral imaging applications; reflection spectra; resonant filters; spectral response; subwavelength grating; tunable leaky-mode MEMS filters; Electromagnetic coupling; Electromagnetic reflection; Electromagnetic scattering; Electromagnetic waveguides; Filters; Gratings; Micromechanical devices; Multispectral imaging; Resonance; Structural engineering;
fLanguage
English
Publisher
ieee
Conference_Titel
Aerospace Conference, 2008 IEEE
Conference_Location
Big Sky, MT
ISSN
1095-323X
Print_ISBN
978-1-4244-1487-1
Electronic_ISBN
1095-323X
Type
conf
DOI
10.1109/AERO.2008.4526383
Filename
4526383
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