DocumentCode
3512906
Title
Characterization of pulse induced plasma fueled by aluminum metallization
Author
Buneo, J.D. ; Zirnheld, J.L. ; Burke, K.M. ; Sarjeant, W.J. ; Sussman, M. ; Freund, C.
Author_Institution
Energy Syst. Inst., Univ. at Buffalo, NY, USA
fYear
2004
fDate
1-1 July 2004
Firstpage
451
Abstract
Summary form only given. Plasmas induced by contaminated surface flashover of insulators can produce serious detrimental effects to the energy systems that incur them. Studies at the Energy Systems Institute (ESI) at the University at Buffalo and the Advanced Energy Armaments Systems Center (AEAS) of U.S. Army ARDEC have been focusing on flashover of thin metallized films for use in low energy light sources. The film under test is capacitor grade metallized polypropylene film cut to dimensions of 12"/spl times/ 3/4 ". Flashover is initiated via a 2 /spl mu/F capacitor charged to 2500 V dc and that is then discharged directly through the film via stainless steel electrodes. Characterization of the flashover is performed through current and voltage probes and photodiodes. Three photodiodes were used to measure the spectral intensity of the thin film flashover. These intensities are in the spectrum of far red, infrared, and visible light. These preliminary investigations will aid in the further development of low energy light sources.
Keywords
aluminium; capacitors; electrodes; flashover; infrared spectra; metallic thin films; metallisation; photodiodes; plasma probes; polymer films; visible spectra; 2 muF; 2500 V; Al; aluminum metallization; capacitor grade metallized polypropylene film; contaminated surface flashover; infrared spectra; light source; photodiode; plasma probe; pulse induced plasma; spectral intensity; stainless steel electrode; thin film flashover; thin metallized film; visible light spectra; Aluminum; Capacitors; Flashover; Insulation; Light sources; Metallization; Photodiodes; Plasmas; Surface contamination; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 2004. ICOPS 2004. IEEE Conference Record - Abstracts. The 31st IEEE International Conference on
Conference_Location
Baltimore, MD, USA
ISSN
0730-9244
Print_ISBN
0-7803-8334-6
Type
conf
DOI
10.1109/PLASMA.2004.1340272
Filename
1340272
Link To Document