DocumentCode
3512960
Title
Automatic segmentation of newborn brain MRI using mathematical morphology
Author
Gui, Laura ; Lisowski, Radoslaw ; Faundez, Tamara ; Hüppi, Petra S. ; Lazeyras, François ; Kocher, Michel
Author_Institution
Fac. of Med., Univ. of Geneva, Geneva, Switzerland
fYear
2011
fDate
March 30 2011-April 2 2011
Firstpage
2026
Lastpage
2030
Abstract
We propose a novel algorithm for the segmentation of newborn brain MRI, based on mathematical morphology. The algorithm combines image information with high-level anatomical knowledge to deal with the difficulties of newborn brain MRI segmentation (lower signal-to-noise ratio, reduced contrast and different brain structure compared to the adult brain). It robustly segments the brain globally (intracranial cavity, cerebellum, brainstem and the two hemispheres) and at tissue level (cortical gray matter, central gray matter, myelinated white matter, unmyelinated white matter and cerebrospinal fluid). Important advantages compared to existing methods are that the proposed algorithm does not require any manual interaction and that it does not require an atlas, whose construction would be tedious and time-consuming. Experimental results show good agreement with expert manual segmentations and qualitative superiority to state-of-the-art methods in the literature.
Keywords
biological tissues; biomedical MRI; brain; image segmentation; mathematical morphology; medical image processing; paediatrics; automatic segmentation; brain MRI; brainstem; central gray matter; cerebellum; cerebrospinal fluid; cortical gray matter; intracranial cavity; manual segmentations; mathematical morphology; myelinated white matter; newborns; signal-to-noise ratio; unmyelinated white matter; Biomedical imaging; Brain; Image segmentation; Magnetic resonance imaging; Manuals; Morphology; Pediatrics; brain imaging; image segmentation; magnetic resonance imaging; mathematical morphology; newborns;
fLanguage
English
Publisher
ieee
Conference_Titel
Biomedical Imaging: From Nano to Macro, 2011 IEEE International Symposium on
Conference_Location
Chicago, IL
ISSN
1945-7928
Print_ISBN
978-1-4244-4127-3
Electronic_ISBN
1945-7928
Type
conf
DOI
10.1109/ISBI.2011.5872810
Filename
5872810
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