DocumentCode :
3513028
Title :
The effect of CdTe growth temperature and ZnTe:Cu contacting conditions on CdTe device performance
Author :
Burst, J.M. ; Rance, W.L. ; Barnes, T.M. ; Reese, M.O. ; Li, J.V. ; Kuciauskas, D. ; Steiner, M.A. ; Gessert, T.A. ; Zhang, K. ; Hamilton, C.T. ; Fuller, K.M. ; Aitken, B.G. ; Williams, C. A Kosik
Author_Institution :
Nat. Renewable Energy Lab., Golden, CO, USA
fYear :
2012
fDate :
3-8 June 2012
Abstract :
CdTe device performance is strongly dependent on the quality of the back contact and the ability of the back contact to introduce a copper doping profile in the CdTe layer itself. Copper-doped ZnTe (ZnTe:Cu) is a nearly ideal contact material for CdTe solar cells due to its work function and ability to source copper to CdTe. Most of the ZnTe:Cu studies in the past used CdTe grown at relatively low deposition temperatures (550°C and below). Here we investigate the use of ZnTe:Cu as a back contact for CdTe grown at temperatures up to 620°C. We observe a strong interplay between the CdTe absorber deposition conditions and optimized ZnTe:Cu contacting conditions. Device JV characteristics suggest that CdTe solar cells with absorber layers deposited by close-space sublimation (CSS) at high temperature, 600-620°C, are more robust to the back contact Cu doping level and contacting temperature than CdTe grown at lower temperatures. The implication for industrial processes is a ~1% absolute increase in device efficiency for devices in which the CdTe is deposited on PV glass at high temperature. Perhaps more importantly, this increased performance is maintained for a larger window of temperature and doping level of the ZnTe:Cu back contact. For devices with CdTe absorbers deposited at 600°C, device efficiency in excess of 13.5% is maintained for back contacts containing 2-5 wt.% Cu, and for contacting temperatures ranging from 300-360°C. Red-light bias quantum efficiency (QE) and capacitance-voltage (CV) measurements are used to probe the effect of the introduced copper doping profiles and net acceptor density to better understand how ZnTe:Cu sources influences the resulting CdTe device.
Keywords :
II-VI semiconductors; absorption; cadmium compounds; copper; semiconductor doping; semiconductor growth; solar cells; sublimation; zinc compounds; CSS; CV measurements; CdTe; PV glass; ZnTe:Cu; absorber deposition conditions; absorber layers; back contact quality; capacitance-voltage measurements; close-space sublimation; contact material; copper doping profile; device JV characteristics; growth temperature effect; low deposition temperatures; net acceptor density; red-light bias quantum efficiency; solar cells; temperature 300 degC to 360 degC; temperature 550 degC; temperature 600 degC to 620 degC; Annealing; Doping; Glass; Performance evaluation; Photovoltaic cells; Temperature; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
Conference_Location :
Austin, TX
ISSN :
0160-8371
Print_ISBN :
978-1-4673-0064-3
Type :
conf
DOI :
10.1109/PVSC.2012.6317598
Filename :
6317598
Link To Document :
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