Title :
Study of the effect of different hole sizes on mechanical strength of wafers for back contact solar cells
Author :
Cereceda, E. ; Barredo, J. ; Gutiérrez, J.R. ; Jimeno, J.C. ; Fraile, A. ; Hermanns, L.
Author_Institution :
Technol. Inst. of Microelectron. (TiM), Univ. of the Basque Country, Zamudio, Spain
Abstract :
Drilling process on wafers to produce EWT or MWT solar cells is a critical fabrication step, which affects on their mechanical stability. The amount of damage introduced during drilling process depends on the density of holes, their size and the chemical process applied afterwards. To quantify the relation between size of the holes and reduction of mechanical strength, several sets of wafers have been prepared, with different hole diameter. The mechanical strength of these sets has been measured by the ring on ring bending test, and the stress state in the moment of failure has been deduced by FE simulation.
Keywords :
finite element analysis; mechanical stability; mechanical strength; solar cells; EWT solar cells; FE simulation; MWT solar cells; back contact solar cells; chemical process; drilling process; emitter wrap through solar cell; hole sizes; mechanical stability; mechanical strength; metal wrap through solar cell; moment of failure; ring bending test; stress state; wafers; Etching; Europe; Photovoltaic cells; Photovoltaic systems; Semiconductor device modeling; Stress; back contact; photovoltaic cells; silicon; stress measurement; surface cracks;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4673-0064-3
DOI :
10.1109/PVSC.2012.6317602