DocumentCode
3513285
Title
Frequency behavior and its stability of grid-interface converter in distributed generation systems
Author
Dong, Dong ; Li, Jin ; Boroyevich, Dushan ; Mattavelli, Paolo ; Cvetkovic, Igor ; Xue, Yaosuo
Author_Institution
Center for Power Electron. Syst. (CPES), Virginia Tech., Blacksburg, VA, USA
fYear
2012
fDate
5-9 Feb. 2012
Firstpage
1887
Lastpage
1893
Abstract
This paper presents a state-feedback model to predict the frequency behavior of the grid-interface converter which uses phase-locked loop (PLL) techniques to synchronize with the grid. The frequency positive-feedback mechanism in the converter system is proposed and quantified in the model. The nonlinear behavior of the PLL under the weak grid condition can be accurately predicted and the large-signal frequency stability region can be also estimated by the proposed model. It shows that large penetration of distributed generation (DG) units, large reactive power variation, and weak grid tends to destabilize the converter frequency operation. The proposed model can help study the electric power system or microgrid operation under a large penetration of renewable energy resources with the power electronic interfaces.
Keywords
distributed power generation; feedback; frequency convertors; phase locked loops; power grids; reactive power; renewable energy sources; converter frequency operation; distributed generation systems; electric power system; frequency positive feedback; grid-interface converter; large-signal frequency stability; microgrid operation; nonlinear behavior; phase-locked loop; power electronic interfaces; reactive power variation; renewable energy resources; state-feedback model; weak grid condition; Distributed power generation; Frequency conversion; Impedance; Phase locked loops; Power system stability; Stability analysis; Switches; Frequency Stability; Grid-interface converter; Microgrid;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Power Electronics Conference and Exposition (APEC), 2012 Twenty-Seventh Annual IEEE
Conference_Location
Orlando, FL
Print_ISBN
978-1-4577-1215-9
Electronic_ISBN
978-1-4577-1214-2
Type
conf
DOI
10.1109/APEC.2012.6166080
Filename
6166080
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