• DocumentCode
    3513482
  • Title

    Modeling distribution and impact of efficiency limiting metallic impurities in silicon solar cells

  • Author

    Schubert, M.C. ; Schön, J. ; Michl, B. ; Abdollahinia, A. ; Warta, W.

  • Author_Institution
    Fraunhofer Inst. for Solar Energy Syst. ISE, Freiburg, Germany
  • fYear
    2012
  • fDate
    3-8 June 2012
  • Abstract
    Although metal impurities are known to limit the efficiency of solar cells especially for the case of multicrystalline silicon the quantitative prediction of carrier lifetime and cell parameters as a function of impurity concentration is complex. Metal point defects as well as precipitates of different sizes and spatial distribution contribute to the overall carrier recombination and thus lifetime and cell efficiency. Diffusion and firing steps significantly modify the concentration but also the distribution and configuration of metal impurities. This article presents our modeling results on iron and chromium impurities which take into account these effects and which consistently explain our experimental findings on metal impurity concentration, distribution, and configuration throughout solar cell processing. Together with a cell simulation which is based on injection dependent carrier lifetime results we have now a tool to quantitatively determine the impact of impurities on cell parameters.
  • Keywords
    chromium; elemental semiconductors; iron; silicon; solar cells; Cr; Fe; Si; carrier lifetime; carrier recombination; cell parameters; metal impurity concentration; metal point defects; metallic impurities; multicrystalline silicon; silicon solar cells; solar cell processing; spatial distribution; Chromium; Computer architecture; Impurities; Iron; Microprocessors; Silicon; Temperature measurement; impurities; modeling; silicon; solar cells;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4673-0064-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2012.6317620
  • Filename
    6317620