DocumentCode :
351353
Title :
Extending Moore´s Law through advances in semiconductor manufacturing equipment
Author :
Sinha, Ashok K.
Author_Institution :
Appl. Mater. Inc., Santa Clara, CA, USA
fYear :
2000
fDate :
2000
Firstpage :
243
Lastpage :
244
Abstract :
Summary form only given, as follows. After more than thirty years of effectiveness, associated benefits to the electronics industry and several false alarms, it appears that Moore´s Law is again threatened with derailment. These threats are in the form of a convergence of three waves which requires major necessary changes relating to: a) lithography below 0.13 μm, which involves printing and aligning at submicron wavelength dimensions with new unproven lasers/lens systems; b) Cu/low-κ interconnect technology, which is facing major challenges in achieving commercially viable yields; and c) 300 mm wafer size conversion, which requires an extensive retooling of the entire industry. These enabling changes are overlaid on increasingly aggressive cost/quality requirements on the semiconductor fabs as the electronics industry evolves into the post-PC, Internet era. The author reviews some of the cutting edge work being done in the semiconductor manufacturing equipment area, including extendability/reuse of existing installed base for multiple generations, improved BKM´s (Best Known Methodologies) and integrated process modules
Keywords :
electronics industry; integrated circuit manufacture; nanotechnology; semiconductor device manufacture; 0.13 micron; 300 mm; BKM improvement; Best Known Methodologies; Cu; Cu/low-κ interconnect technology; Moore´s Law extension; electronics industry; integrated process modules; nanolithography; retooling; semiconductor fabs; semiconductor manufacturing equipment; wafer size conversion; Electronics industry; Laser transitions; Lenses; Lithography; Manufacturing industries; Moore´s Law; Printing; Railway accidents; Semiconductor lasers; Wavelength conversion;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design, 2000. ISQED 2000. Proceedings. IEEE 2000 First International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-0525-2
Type :
conf
DOI :
10.1109/ISQED.2000.838878
Filename :
838878
Link To Document :
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