DocumentCode :
351354
Title :
Correct-by-design CAD enhancement for EMI and signal integrity
Author :
McShane, Erik A. ; Shenai, Krishna
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Illinois Univ., Chicago, IL, USA
fYear :
2000
fDate :
2000
Firstpage :
341
Lastpage :
345
Abstract :
The monolithic integration of mixed-signal and RF microelectronics is straining the capabilities of present CAD roots for predictive analysis. In particular, the effects of di/dt, crosstalk, high-frequency impedance matching, and substrate noise pose challenges to reliable circuit operation. This is especially true as supply rail voltages continue to shrink below 2.5 V. Although PCB CAD tools have successfully addressed these issues, similar. tools have yet to penetrate the VLSIC/RFIC market due to the even greater signal frequencies and far greater network density. We describe an ongoing research effort to introduce models of these effects into a commercial CAD tool. The goal is to develop a correct-by-design CAD system in which constraints on signal crosstalk and EMI are considered along with signal delay and power restrictions in performing automated floor-planning and routing. To permit top-down synthesis of reliable systems, we are also expanding the HDL coding of digital systems to include two additional parameters: EMI victim status and EMl point-source contributions
Keywords :
MMIC; UHF integrated circuits; VLSI; circuit CAD; crosstalk; electromagnetic interference; hardware description languages; impedance matching; integrated circuit design; integrated circuit noise; mixed analogue-digital integrated circuits; 2.5 V; EMI; HDL coding; RF microelectronics; VLSIC; automated floor-planning; correct-by-design CAD enhancement; crosstalk; high-frequency impedance matching; mixed-signal microelectronics; network density; point-source contributions; power restrictions; predictive analysis; signal delay; signal frequencies; signal integrity; substrate noise; supply rail voltages; top-down synthesis; victim status; Circuit noise; Crosstalk; Electromagnetic interference; Impedance matching; Integrated circuit reliability; Microelectronics; Monolithic integrated circuits; Radio frequency; Rails; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design, 2000. ISQED 2000. Proceedings. IEEE 2000 First International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-0525-2
Type :
conf
DOI :
10.1109/ISQED.2000.838894
Filename :
838894
Link To Document :
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