Title :
Electronic process limited yield
Author :
Maier, Gary W. ; Smith, Shawn
Author_Institution :
Power PC Product Eng., IBM Corp., USA
Abstract :
Today´s industry is expanding the high performance microprocessor market into the consumer market place. This market requires very low cost, high reliability, stricter SPQL levels, and very high yields. A New Diagnostic Methodology is required to meet these new demands. This paper addresses a broad scope of issues from Product Design and Manufacturing Test, to Diagnostic and Data Analysis Tools. It describes a beta test case currently in operation on IBM´s latest PowerPC products in their copper and SOI technologies
Keywords :
consumer electronics; fault diagnosis; integrated circuit reliability; integrated circuit testing; integrated circuit yield; microprocessor chips; production testing; PowerPC products; SOI technologies; SPQL levels; beta test case; consumer market; data analysis tools; diagnostic methodology; high performance microprocessor market; manufacturing test; process limited yield; product design; reliability; Algorithms; Built-in self-test; Clocks; Condition monitoring; Design engineering; Electronic equipment testing; Manufacturing processes; Pattern matching; Power engineering and energy; Product design;
Conference_Titel :
Quality Electronic Design, 2000. ISQED 2000. Proceedings. IEEE 2000 First International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-0525-2
DOI :
10.1109/ISQED.2000.838924
