Contrast enhancement of luminescence images via point-spread deconvolution

Author

Walter, Daniel ; Liu, Anyao ; Franklin, Evan ; Macdonald, Daniel ; Mitchell, Bernhard ; Trupke, Thorsten

Author_Institution

Centre for Sustainable Energy Syst., Australian Nat. Univ., Canberra, ACT, Australia

fYear

2012

fDate

3-8 June 2012

Abstract

We investigate the impact of point-spread in the silicon CCD sensor of a BT Imaging LIS-R1 luminescence imaging system. It is found that an experimental definition of the point-spread function allows for a significant restoration of CCD point-spread to be achieved. A comparison with short-pass filtering is performed, demonstrating that point-spread will still have a measurable influence on image quality while reducing the luminescence signal and increasing the relative noise level. An implementation of point-spread deconvolution is presented at a multi-crystalline silicon grain boundary, illustrating a practical enhancement of resolution in a typical high-contrast scenario. The characteristics of the point-spread presented here are specific to the experimental apparatus investigated, but the procedure described is universally applicable.

Keywords

CCD image sensors; deconvolution; elemental semiconductors; grain boundaries; optical filters; optical transfer function; photoluminescence; silicon; BT imaging; LIS-R1 luminescence imaging system; Si; image quality; multicrystalline silicon grain boundary; photoluminescence; point-spread deconvolution function; relative noise level; short-pass filtering; silicon CCD sensor; Charge coupled devices; Deconvolution; Filtering; Imaging; Luminescence; Photonics; Silicon; deconvolution; luminescence imaging; point-spread function;

fLanguage

English

Publisher

ieee

Conference_Titel

Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE

Conference_Location

Austin, TX

ISSN

0160-8371

Print_ISBN

978-1-4673-0064-3

Type

conf

DOI

10.1109/PVSC.2012.6317624

Filename

6317624