• DocumentCode
    3513570
  • Title

    Differential power processing architecture for increased energy production and reliability of photovoltaic systems

  • Author

    Shenoy, Pradeep S. ; Johnson, Brian ; Krein, Philip T.

  • Author_Institution
    ECE Dept., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
  • fYear
    2012
  • fDate
    5-9 Feb. 2012
  • Firstpage
    1987
  • Lastpage
    1994
  • Abstract
    Conventional energy conversion architectures in photovoltaic (PV) systems are often forced to trade off conversion efficiency and power production. This paper introduces a power processing architecture that enables each PV element to operate at its maximum power point (MPP) while only processing a small fraction of the total power produced. This is accomplished by providing only the mismatch in the MPP current of a set of series-connected PV elements. The differential power processing architecture increases overall conversion efficiency and overcomes the challenges of unmatched MPPs (due to partial shading, damage, manufacturing tolerances, etc.). Local control of the differential converters enables distributed protection and monitoring. The reliability analysis included in this paper shows significantly increased overall system reliability. Simulation and experimental results are included to demonstrate the benefits of this approach.
  • Keywords
    maximum power point trackers; photovoltaic power systems; power convertors; power generation control; power generation protection; power generation reliability; conversion efficiency; differential converter; differential power processing; distributed protection; increased energy production; maximum power point; photovoltaic system reliability; power production; series connected photovoltaic element; Computer architecture; Integrated circuit modeling; Inverters; Monitoring; Power system reliability; Reliability; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2012 Twenty-Seventh Annual IEEE
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    978-1-4577-1215-9
  • Electronic_ISBN
    978-1-4577-1214-2
  • Type

    conf

  • DOI
    10.1109/APEC.2012.6166095
  • Filename
    6166095