DocumentCode :
3513594
Title :
FPGA-based direct resistance and capacitance measurements
Author :
Ares, Luis ; Rodríguez-Andina, Juan J. ; Farina, José
Author_Institution :
Dept. of Electron. Technol., Univ. of Vigo, Vigo, Spain
fYear :
2009
fDate :
3-5 Nov. 2009
Firstpage :
2837
Lastpage :
2841
Abstract :
This paper presents a system that allows the measurement of some electrical parameters (namely resistance and capacitance) to be carried out through the direct connection of the target component to an FPGA, without the need for an analog-to-digital converter or excitation circuits. The system is based on a measurement method previously described in the literature, in which sensors are directly connected to microcontrollers. The increasing number of application domains of FPGAs makes it interesting to develop new functional blocks for these devices. In addition, advantage can be taken from the features of currently available FPGAs to deal with some practical limitations of the microcontroller-based solution, for instance by adaptively defining the measurement range. Experimental results are presented to demonstrate the capabilities of the proposed system.
Keywords :
capacitance measurement; computerised instrumentation; digital control; electric resistance measurement; field programmable gate arrays; microcontrollers; FPGA; analog-to-digital converter; capacitance measurement; digital controller; electrical parameters; excitation circuits; field programmable gate array; microcontroller; resistance measurement; sensors; Analog-digital conversion; Capacitance measurement; Circuits; Electric resistance; Electric variables measurement; Electrical resistance measurement; Field programmable gate arrays; Microcontrollers; Sensor phenomena and characterization; Sensor systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics, 2009. IECON '09. 35th Annual Conference of IEEE
Conference_Location :
Porto
ISSN :
1553-572X
Print_ISBN :
978-1-4244-4648-3
Electronic_ISBN :
1553-572X
Type :
conf
DOI :
10.1109/IECON.2009.5415404
Filename :
5415404
Link To Document :
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