DocumentCode
3513686
Title
Voltage-offset resistive control for DC-DC converters in photovoltaic applications
Author
Kim, Katherine A. ; Li, Ran M. ; Krein, Philip T.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
fYear
2012
fDate
5-9 Feb. 2012
Firstpage
2045
Lastpage
2052
Abstract
Photovoltaic (PV) systems must be able to maintain stable operation near the maximum power point (MPP) regardless of environmental conditions. Voltage-offset resistive control (VRC) exhibits inherently low sensitivity to irradiance changes and supports effective inner-loop control to maintain MPP operation. Small- and large-signal analysis show that VRC employed with a boost converter is stable for PV applications. VRC is tested on an experimental setup using a digital controller, PV boost converter, and dc-link load. Irradiance and control parameter step responses are observed through simulated and experimental results. VRC exhibits stable and fast transient response. Traditional and VRC maximum power point tracking (MPPT) methods that utilize sample-and-hold operation are compared through simulation. The fractional open-circuit voltage VRC and MPP-current-based VRC methods are identified as effective, simple control solutions for PV systems that seek to maintain high efficiency under irradiance transients.
Keywords
digital control; maximum power point trackers; photovoltaic power systems; sample and hold circuits; stability; sunlight; voltage control; DC link load; DC-DC converter; MPPT current based VRC method; boost converter; control parameter; digital controller; fractional open circuit voltage; inner loop control; irradiance parameter; maximum power point tracking; photovoltaic applications; sample and hold operation; stable operation; voltage offset resistive control; Asymptotic stability; Capacitors; Equations; Mathematical model; Stability analysis; Transient analysis; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Power Electronics Conference and Exposition (APEC), 2012 Twenty-Seventh Annual IEEE
Conference_Location
Orlando, FL
Print_ISBN
978-1-4577-1215-9
Electronic_ISBN
978-1-4577-1214-2
Type
conf
DOI
10.1109/APEC.2012.6166103
Filename
6166103
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