• DocumentCode
    3513928
  • Title

    Photoemission study of CdTe surfaces after low-energy ion treatments

  • Author

    Hanks, D. ; Weir, M. ; Horsley, K. ; Hofmann, T. ; Weinhardt, L. ; Bär, M. ; Barricklow, K. ; Kobyakov, P. ; Sampath, W. ; Heske, C.

  • Author_Institution
    Dept. of Chem., Univ. of Nevada, Las Vegas, NV, USA
  • fYear
    2012
  • fDate
    3-8 June 2012
  • Abstract
    We present a study of low-energy ion surface cleaning treatments and their impact on the surface electronic structure of an air-exposed CdTe thin film treated with CdCl2. In order to determine the electronic structure using surface-sensitive photoemission, surfaces need to be free of contaminants. This is achieved by subsequent low-energy ion treatment steps, carefully monitoring the chemical and electronic surface structure. We present data on the valence band maximum (VBM), and core-level binding energies, that suggest that neither preferential sputtering occurs nor metallic states are formed using our cleaning procedure. For a clean CdTe surface, the VBM is determined to be (0.8 ± 0.1) eV below the Fermi energy.
  • Keywords
    Fermi level; II-VI semiconductors; binding energy; cadmium compounds; core levels; photoemission; semiconductor thin films; sputter deposition; surface cleaning; surface contamination; surface structure; valence bands; wide band gap semiconductors; CdTe; Fermi energy; chemical surface structure; core-level binding energy; electronic surface structure; low-energy ion surface cleaning treatment; surface electronic structure; surface-sensitive photoemission; thin film; valence band maximum; Argon; Chemicals; Spectroscopy; Surface cleaning; Surface contamination; cadmium telluride; photoemission; surface band alignment; surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4673-0064-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2012.6317643
  • Filename
    6317643