Title :
Measurement of internal optical reflection characteristics of solar cell back reflectors
Author :
Kampwerth, Henner ; Yang, Yang ; Green, Martin A.
Author_Institution :
Sch. of Photovoltaic & renewable Energy Eng., Univ. of New South Wales, Sydney, NSW, Australia
Abstract :
The optimization work of high-efficient solar cells includes light-trapping schemes for the weakly absorbed near-infrared (NIR) photons. The light scattering properties of the back-reflector are here of particular interest. Novel back reflector designs that employ plasmonic and multi-stack interference effects require especially an experimental verification of the numerical simulations. Unfortunately, a good measurement of these scatter properties is nontrivial due to the refractive index of silicon and its resulting angle of total reflection. On planar wafers, light can therefore only be coupled in and out of silicon in a quite narrow angle, impossible to measure wider angles. Therefore we present an experimental setup to measure the angular resolved scatter properties of back-reflectors for IR photons.
Keywords :
elemental semiconductors; infrared spectra; light scattering; numerical analysis; optical elements; optimisation; plasmonics; refractive index; silicon; solar cells; Si; internal optical reflection characteristics; light scattering; light-trapping; multistack interference effects; numerical simulations; optimization; planar wafers; plasmonic interference effects; refractive index; silicon; solar cell back reflectors; weakly absorbed near-infrared photons; Laser beams; Lenses; Lighting; Measurement by laser beam; Optical variables measurement; Photovoltaic cells; Silicon; optical reflection; optical variables measurement; optimization methods; photovoltaic cells; reflectivity;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4673-0064-3
DOI :
10.1109/PVSC.2012.6317646
