Dielectric and electrical conductivity studies of flux grown KTiOPO 4 and KRbTiOPO4 single crystals

Single crystals of KTiOPO₄ (KTP) and K_0.5Rb _0.5TiOPO₄ have been grown using the slow cooling flux method. For the growth of KTP crystals, two types of fluxes have been used (i) phosphate flux (ii) tungstate flux. Dielectric constant (K), dielectric loss (tan δ) and electrical conductivity (σ) of these crystals are measured at different frequencies (10 KHz-10 MHz) and temperatures (273 K-573 K). The effect of the applied frequency and temperature on the dielectric constant, dielectric loss and conductivity are investigated. KRbTP crystals dielectric constant and electrical conductivity are found to be less when compared to KTP due to the presence of Rb ion. The dielectric and electrical conductivity results indicate that the tungsten (W⁶⁺) impurity is incorporated into the tungsten based flux grown KTP crystals at Ti⁴⁺ sites which was used as part of the solvent system