DocumentCode :
3514305
Title :
EMI noise attenuation prediction with mask impedance in motor drive system
Author :
Wang, Ruxi ; Blanchette, Handy Fortin ; Boroyevich, Dushan ; Mattavelli, Paolo
Author_Institution :
Center for Power Electron. Syst., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
fYear :
2012
fDate :
5-9 Feb. 2012
Firstpage :
2279
Lastpage :
2284
Abstract :
This paper presents insertion gain predictions for both the differential mode (DM) and the common mode (CM) of an EMI filter. The proposed approach, essentially based on measurements, allows prediction of EMI filter performance for high-complexity converters without time-consuming simulations. The key idea is to use direct measurements to represent the complex system by an equivalent circuit in the frequency domain. The source impedance, which is the more complex part of this equivalent circuit because of its non-linear time variation, is carefully analyzed for continuous current mode (CCM) in boost configuration. This study shows that the source impedance is generally masked by external impedance and can be treated as a linear system. Experimental results for insertion gain prediction are included for second-order filters for both DM and CM on a three-phase SiC JFET Vienna/two-level converter.
Keywords :
electromagnetic interference; equivalent circuits; motor drives; power convertors; silicon compounds; wide band gap semiconductors; EMI filter; EMI noise attenuation; SiC; common mode; continuous current mode; differential mode; equivalent circuit; high-complexity converters; insertion gain predictions; linear system; mask impedance; motor drive system; second-order filters; three-phase JFET Vienna/two-level converter; Delta modulation; Electromagnetic interference; Equivalent circuits; Impedance; Impedance measurement; Inductance; Noise; Active energy storage; Capacitive energy storage; High power density converter; Ripple energy; Single phase rectifier;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Power Electronics Conference and Exposition (APEC), 2012 Twenty-Seventh Annual IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4577-1215-9
Electronic_ISBN :
978-1-4577-1214-2
Type :
conf
DOI :
10.1109/APEC.2012.6166140
Filename :
6166140
Link To Document :
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