DocumentCode :
3514368
Title :
Optimized biasing technique for high-speed digital circuits with advanced CMOS nanotechnology
Author :
Wang, Bo ; Chen, Dianyong ; Liang, Bangli ; Kwasniewski, Tad
Author_Institution :
Dept. of Electron., Carleton Univ., Ottawa, ON
fYear :
2008
fDate :
15-15 Oct. 2008
Firstpage :
181
Lastpage :
184
Abstract :
This paper presents a biasing optimization technique for high-speed digital circuits design with advanced CMOS nanotechnology. Modern CMOS nanotechnology introduces several new problems in high-speed circuits design. As the fastest signal frequency components approach the peak transition frequency of the MOSFET, which depends heavily on the biasing voltage, the optimized biasing techniques become very important in high-speed circuits. Many trade-offs in the high-speed circuits need to be considered, and either power or headroom may be traded for higher speed. The optimized biasing technique is thoroughly analyzed first in this paper, and a typical high-speed CML circuit is designed based on this technique.
Keywords :
CMOS digital integrated circuits; MOSFET; high-speed integrated circuits; integrated circuit design; nanoelectronics; optimisation; CMOS nanotechnology; MOSFET; biasing optimization technique; high-speed CML circuit design; high-speed digital circuits; signal frequency components; CMOS digital integrated circuits; CMOS technology; Circuit synthesis; Design optimization; Digital circuits; Frequency; MOSFET circuits; Nanotechnology; Semiconductor device modeling; Voltage; CML; CMOS; deep-submicron (DSM); high-speed digital circuits; nano-technology; ultra-deep-submicron (UDSM);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microsystems and Nanoelectronics Research Conference, 2008. MNRC 2008. 1st
Conference_Location :
Ottawa, Ont.
Print_ISBN :
978-1-4244-2920-2
Electronic_ISBN :
978-1-4244-2921-9
Type :
conf
DOI :
10.1109/MNRC.2008.4683408
Filename :
4683408
Link To Document :
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