DocumentCode
3514699
Title
Research and development of stress-damage models library
Author
Shan, Kunlun ; Shao, Jiang ; Li, Yonghong ; Xu, Ming
Author_Institution
Quality Eng. Centre, CAPE, Beijing, China
fYear
2009
fDate
20-24 July 2009
Firstpage
205
Lastpage
207
Abstract
The constitution and classification of stress-damage models based on POF (physics of failure) were discussed, and the investigation method and technical approach were brought forward, at last the establishment of stress-damage models library with commercial engineering software was illustrated while researching plan was carried out.
Keywords
electronic engineering computing; failure analysis; stress effects; electronic product failure; physics of failure; stress-damage model library; Chemical analysis; Failure analysis; Life estimation; Physics; Reliability engineering; Research and development; Software libraries; Temperature; Testing; Thermal stresses; Physics of Failure (POF); Stress-damage models; reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability, Maintainability and Safety, 2009. ICRMS 2009. 8th International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-4903-3
Electronic_ISBN
978-1-4244-4905-7
Type
conf
DOI
10.1109/ICRMS.2009.5270209
Filename
5270209
Link To Document