Title :
Parameter extraction using lateral and vertical optimization
Author :
Ortiz-Conde, A. ; Ma, Yuansheng ; Thomson, J. ; Santos, E. ; Liou, J.J. ; Sánchez, F. J Garcìa ; Lei, M. ; Finol, J. ; Layman, P.
Author_Institution :
Dept. of Electron., Univ. Simon Bolivar, Caracas, Venezuela
Abstract :
We revisited the direct lateral optimization method, which is based on the approach of minimizing the error on the lateral axis. We compare the efficiency and robustness of the widely used vertical optimization and the present lateral optimization methods
Keywords :
optimisation; semiconductor device models; error minimization; lateral optimization; parameter extraction; semiconductor device; vertical optimization; Extrapolation; Low pass filters; Measurement errors; Optimization methods; Parameter extraction; Robustness; Semiconductor devices; Semiconductor diodes; USA Councils; Voltage;
Conference_Titel :
Microelectronics, 2000. Proceedings. 2000 22nd International Conference on
Conference_Location :
Nis
Print_ISBN :
0-7803-5235-1
DOI :
10.1109/ICMEL.2000.840546
