• DocumentCode
    3514870
  • Title

    GaN HFET switching characteristics at 350V/20A and synchronous boost converter performance at 1MHz

  • Author

    Hughes, Brian ; Lazar, James ; Hulsey, Stephen ; Zehnder, Daniel ; Matic, Daniel ; Boutros, Karim

  • Author_Institution
    HRL Labs. LLC, Malibu, CA, USA
  • fYear
    2012
  • fDate
    5-9 Feb. 2012
  • Firstpage
    2506
  • Lastpage
    2508
  • Abstract
    Gallium Nitride HFET (Hetero-junction Field Effect Transistors) power switches are poised to replace silicon MOSFETs and IGBTs in many high-performance power switching applications. To realize the benefits of these fast-switching GaN devices, special circuit and packaging techniques are necessary. Drive circuits are significantly improved compared to conventional silicon MOSFET drivers. SMD packaging techniques are employed to minimize source inductance. The gate drive provides rise time of a few ns, and drain voltage slew rates of more than 80 V/ns are observed. These circuits are used for double-pulse switching performance characterization and in a synchronous boost converter operating under the same switching conditions. The GaN HFETs switch 350V and 20A in 15 ns with switching energy of 68 μJ. The 1MHz 300V synchronous switching boost converter is 94% efficient, with an output power of 1.2KW.
  • Keywords
    III-V semiconductors; driver circuits; gallium compounds; high electron mobility transistors; power semiconductor switches; surface mount technology; switching convertors; wide band gap semiconductors; GaN; HFET switching characteristics; IGBT; SMD packaging technique; circuit technique; conventional silicon MOSFET driver; current 20 A; double-pulse switching performance; drain voltage; drive circuit; fast-switching GaN device; frequency 1 MHz; gallium nitride HFET power switch; gate drive; heterojunction field effect transistor; high-performance power switching application; packaging technique; source inductance minimization; switching conditions; synchronous switching boost converter performance; voltage 350 V; Current measurement; Gallium nitride; Inductance; Logic gates; Silicon; Switches; Switching circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2012 Twenty-Seventh Annual IEEE
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    978-1-4577-1215-9
  • Electronic_ISBN
    978-1-4577-1214-2
  • Type

    conf

  • DOI
    10.1109/APEC.2012.6166174
  • Filename
    6166174