DocumentCode
3514874
Title
An investigation of electroless copper films deposited on glass
Author
Cui, Xiaoyun ; Hutt, David A. ; Conway, Paul P.
Author_Institution
Wolfson Sch. of Mech. & Manuf. Eng., Loughborough Univ., Loughborough
fYear
2008
fDate
1-4 Sept. 2008
Firstpage
105
Lastpage
110
Abstract
This paper describes the characterization of electroless copper deposition on glass substrates with respect to surface morphology and adhesion. Silanisation of the glass surfaces with (3-aminopropyl)-trimethoxysilane (APTS) was used to provide a surface-coupled layer of functional molecules to assist in the improvement of adhesion of a Pd/Sn catalyst and the subsequent copper deposition. Surface morphology of the deposited films was characterized by field emission scanning electron microscopy (SEM) and together with atomic force microscopy (AFM), showed that the roughness and grain size tended to increase with the plating time. Tape peel testing was used to assess the adhesion of the coatings. All the deposits prepared with an electroless bath temperature of 40degC with a thickness up to 150 nm were found to adhere well to the glass substrate. Copper films were peeled off easily with increased thickness. This paper focuses on the development of thin copper films (Lt 200 nm thick) and considers the early stages of deposition in order to investigate further the role of the catalyst on adhesion.
Keywords
atomic force microscopy; electronic products; flip-chip devices; glass; printed circuits; scanning electron microscopy; surface morphology; thin films; Cu; SEM; atomic force microscopy; electroless bath temperature; electroless copper films deposition; field emission scanning electron microscopy; flip-chip substrates; glass substrates; glass surfaces silanisation; high density packaging; printed circuit board substrates; surface adhesion; surface morphology; surface-coupled layer; tape peel testing; temperature 40 degC; Adhesives; Atomic force microscopy; Copper; Electron emission; Glass; Rough surfaces; Scanning electron microscopy; Surface morphology; Surface roughness; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics System-Integration Technology Conference, 2008. ESTC 2008. 2nd
Conference_Location
Greenwich
Print_ISBN
978-1-4244-2813-7
Electronic_ISBN
978-1-4244-2814-4
Type
conf
DOI
10.1109/ESTC.2008.4684333
Filename
4684333
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