Title :
Dynamic fault tree analysis based on Petri nets
Author :
Zhang, Xiaojie ; Miao, Qiang ; Fan, Xianfeng ; Wang, Dong
Author_Institution :
Sch. of Mechatron. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Abstract :
In traditional dynamical fault tree analysis, it is necessary to modularize DFT tree firstly so as to obtain static subtrees and dynamic subtrees. Generally, binary decision diagram (BDD) and Markov chains are utilized in the DFT to process static and dynamic subtrees, respectively. However, due to the possibility of state combinatorial explosion problem in Markov chain, it is difficult to analyze system with DFT in some cases. This paper investigated Petri net method in DFT in order to solve this problem. An example of processor system is analyzed with the proposed Petri net based DFT, which contains many dynamic logic gates in two classes. The analysis results show that the proposed method can overcome the state combinatorial explosion problem and guarantee high accuracy.
Keywords :
Markov processes; Petri nets; binary decision diagrams; fault trees; reliability theory; BDD; Markov chain; Petri net; binary decision diagram; dynamic fault tree analysis; dynamic logic gate; dynamic subtree; processor system; reliability theory; state combinatorial explosion problem; static subtree; Binary decision diagrams; Boolean functions; Data structures; Explosions; Fault trees; Logic gates; Mechatronics; Object oriented modeling; Petri nets; Solids; Dynamic Fault Tree; Markov; Petri net; Reliability Modeling;
Conference_Titel :
Reliability, Maintainability and Safety, 2009. ICRMS 2009. 8th International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-4903-3
Electronic_ISBN :
978-1-4244-4905-7
DOI :
10.1109/ICRMS.2009.5270223