DocumentCode
351498
Title
ESD protection techniques for semiconductor devices
Author
Vinson, J.E. ; Liou, J.J.
Author_Institution
Reliability Dept., Harris Semicond., Melbourne, FL, USA
Volume
1
fYear
2000
fDate
2000
Firstpage
311
Abstract
Electrostatic discharges (ESD) are everywhere-in our homes, businesses and even at the manufacturers of the electronics we buy. The discharges cause failure of these electronic components. Presented here is a two pronged approach for ESD protection: reduce the likelihood of having an ESD event and improving the robustness of the devices. The first approach focuses on reducing the charge developed and controlling the redistribution of any charges that are developed. The second approach looks at ways to improve both the processes used to build electronics as well as the devices themselves
Keywords
electrostatic discharge; failure analysis; semiconductor device reliability; ESD protection techniques; electrostatic discharges; failure; semiconductor devices; Biological system modeling; Capacitors; Circuits; Electrostatic discharge; Humans; Protection; Robustness; Semiconductor devices; USA Councils; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics, 2000. Proceedings. 2000 22nd International Conference on
Conference_Location
Nis
Print_ISBN
0-7803-5235-1
Type
conf
DOI
10.1109/ICMEL.2000.840579
Filename
840579
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