• DocumentCode
    351498
  • Title

    ESD protection techniques for semiconductor devices

  • Author

    Vinson, J.E. ; Liou, J.J.

  • Author_Institution
    Reliability Dept., Harris Semicond., Melbourne, FL, USA
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    311
  • Abstract
    Electrostatic discharges (ESD) are everywhere-in our homes, businesses and even at the manufacturers of the electronics we buy. The discharges cause failure of these electronic components. Presented here is a two pronged approach for ESD protection: reduce the likelihood of having an ESD event and improving the robustness of the devices. The first approach focuses on reducing the charge developed and controlling the redistribution of any charges that are developed. The second approach looks at ways to improve both the processes used to build electronics as well as the devices themselves
  • Keywords
    electrostatic discharge; failure analysis; semiconductor device reliability; ESD protection techniques; electrostatic discharges; failure; semiconductor devices; Biological system modeling; Capacitors; Circuits; Electrostatic discharge; Humans; Protection; Robustness; Semiconductor devices; USA Councils; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 2000. Proceedings. 2000 22nd International Conference on
  • Conference_Location
    Nis
  • Print_ISBN
    0-7803-5235-1
  • Type

    conf

  • DOI
    10.1109/ICMEL.2000.840579
  • Filename
    840579