DocumentCode :
351504
Title :
Thermal simulation of high-lead count packages
Author :
Hanreich, G. ; Musiejovsky, L. ; Nicolics, J. ; Riedling, K.
Author_Institution :
Inst. of Mater. Sci. & Electr. Eng., Wien Univ., Austria
Volume :
1
fYear :
2000
fDate :
2000
Firstpage :
351
Abstract :
An efficient thermal management in electronic components is essential to minimize the influence of thermomechanically induced stress and thermal load. To reduce the effort caused by measuring the thermal behavior of semiconductor components frequently thermal simulation is applied. However, using commercially available software packages high effort is necessary for maintenance and for generating the thermal models. In addition the limitation of the node number does not allow spatial discretization sufficiently fine for high lead count packages. In this paper a new thermal simulation tool is presented which allows to establish models in a very efficient way. The developed and implemented solver based on the alternating direction implicit method (ADI-method) is efficiently processing the required high node number. Moreover, in this paper the developed thermal simulation tool is applied for the thermal characterization of a 176 lead QFP-Package using a discretization with 320.000 nodes. Steady-state and transient thermal qualities of the package are investigated
Keywords :
packaging; thermal management (packaging); QFP package; alternating direction implicit method; discretization; high-lead count package; numerical algorithm; semiconductor component; software package; thermal management; thermal simulation; Electronic components; Electronic packaging thermal management; Semiconductor device packaging; Software packages; Steady-state; Thermal loading; Thermal management; Thermal management of electronics; Thermal stresses; Thermomechanical processes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronics, 2000. Proceedings. 2000 22nd International Conference on
Conference_Location :
Nis
Print_ISBN :
0-7803-5235-1
Type :
conf
DOI :
10.1109/ICMEL.2000.840587
Filename :
840587
Link To Document :
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