• DocumentCode
    351504
  • Title

    Thermal simulation of high-lead count packages

  • Author

    Hanreich, G. ; Musiejovsky, L. ; Nicolics, J. ; Riedling, K.

  • Author_Institution
    Inst. of Mater. Sci. & Electr. Eng., Wien Univ., Austria
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    351
  • Abstract
    An efficient thermal management in electronic components is essential to minimize the influence of thermomechanically induced stress and thermal load. To reduce the effort caused by measuring the thermal behavior of semiconductor components frequently thermal simulation is applied. However, using commercially available software packages high effort is necessary for maintenance and for generating the thermal models. In addition the limitation of the node number does not allow spatial discretization sufficiently fine for high lead count packages. In this paper a new thermal simulation tool is presented which allows to establish models in a very efficient way. The developed and implemented solver based on the alternating direction implicit method (ADI-method) is efficiently processing the required high node number. Moreover, in this paper the developed thermal simulation tool is applied for the thermal characterization of a 176 lead QFP-Package using a discretization with 320.000 nodes. Steady-state and transient thermal qualities of the package are investigated
  • Keywords
    packaging; thermal management (packaging); QFP package; alternating direction implicit method; discretization; high-lead count package; numerical algorithm; semiconductor component; software package; thermal management; thermal simulation; Electronic components; Electronic packaging thermal management; Semiconductor device packaging; Software packages; Steady-state; Thermal loading; Thermal management; Thermal management of electronics; Thermal stresses; Thermomechanical processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 2000. Proceedings. 2000 22nd International Conference on
  • Conference_Location
    Nis
  • Print_ISBN
    0-7803-5235-1
  • Type

    conf

  • DOI
    10.1109/ICMEL.2000.840587
  • Filename
    840587