DocumentCode :
3515145
Title :
Ultrafast X-ray diffraction measurements with a laser-produced plasma source
Author :
Jimenez, R. ; Rose-Petruck, C. ; Ting Guo ; Squier, J. ; Walker, B. ; Wilson, K.R. ; Barty, C.P.J.
Author_Institution :
Dept. of Chem. & Biochem., California Univ., San Diego, La Jolla, CA, USA
fYear :
1998
fDate :
3-8 May 1998
Firstpage :
84
Abstract :
Summary form only given. We demonstrate picosecond time-resolved X-ray diffraction from GaAs single crystals using a tabletop ultrafast X-ray diffractometer with a laser plasma X-ray source. Excitation of the crystal with 800-nm, 40 fs, 20Hz laser pump pulses initiates rapid lattice dynamics, which, after a variable delay time, are probed by diffracting ultrafast Cu K X-ray pulses from the (111)-planes.
Keywords :
III-V semiconductors; X-ray diffraction; gallium arsenide; high-speed optical techniques; plasma production by laser; (111)-planes; 40 fs; 800 nm; GaAs; GaAs single crystals; diffracting ultrafast Cu K X-ray pulses; laser plasma X-ray source; laser pump pulses; laser-produced plasma source; picosecond time-resolved X-ray diffraction; rapid lattice dynamics; tabletop ultrafast X-ray diffractometer; ultrafast X-ray diffraction measurements; variable delay time; Crystals; Gallium arsenide; Laser excitation; Lattices; Optical pulses; Plasma measurements; Plasma x-ray sources; Pump lasers; X-ray diffraction; X-ray lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 1998. CLEO 98. Technical Digest. Summaries of papers presented at the Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-339-0
Type :
conf
DOI :
10.1109/CLEO.1998.675898
Filename :
675898
Link To Document :
بازگشت