DocumentCode :
3515511
Title :
Thermo-mechanical pre-optimisation of radar sensor design by means of FEA and microDAC measurements
Author :
Sommer, J.-P. ; Michel, Bruno ; Noack, E. ; Seiler, Bettina
Author_Institution :
Micro Mater. Center Chemnitz, Chemnitz
fYear :
2008
fDate :
1-4 Sept. 2008
Firstpage :
359
Lastpage :
364
Abstract :
More and more dense packaging is one of the most important challenges in advanced electronics and micro technology, driven by requirements like low cost and high reliability. One way to meet these demands is to follow the so-called ldquochip in duromerrdquo approach, which allows an extremely dense integration and very short interconnects. Already in the very first design phase of advanced products, numerical studies by means of finite element analyses (FEA) are very efficient to check the desired properties regarding functionality as well as reliability aspects. This has been carried out with a new generation of active distance control (ADC) devices for automobiles, based on a radar principle. In order to obtain sufficiently flat modules for subsequent manufacturing steps, thermally induced deformations were measured at suitable specimens by means of the microDAC technique, developed by CWM GmbH Chemnitz and Fraunhofer IZM. Combining FE analyses and measured deformations, a methodology was developed which can be generalised and applied to many design procedures before any real parts are available. It is helpful to reduce cost and time-to-market for future products by minimising real tests and an expensive redesign.
Keywords :
deformation; finite element analysis; optimisation; printed circuit design; printed circuit manufacture; reliability; stress analysis; thermomechanical treatment; FEA; active distance control; deformations; dense packaging; finite element analysis; microDAC; radar principle; radar sensor design; reliability; thermo-mechanical preoptimisation; Copper; Costs; Dielectric measurements; Integrated circuit interconnections; Plastics; Process design; Radar measurements; Testing; Thermal sensors; Thermomechanical processes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics System-Integration Technology Conference, 2008. ESTC 2008. 2nd
Conference_Location :
Greenwich
Print_ISBN :
978-1-4244-2813-7
Electronic_ISBN :
978-1-4244-2814-4
Type :
conf
DOI :
10.1109/ESTC.2008.4684375
Filename :
4684375
Link To Document :
بازگشت