DocumentCode :
3515519
Title :
Impact of interface recombination on time resolved photoluminescence (TRPL) decays in CdTe solar cells (numerical simulation analysis)
Author :
Kanevce, Ana ; Kuciauskas, Darius ; Gessert, Timothy A. ; Levi, Dean H. ; Albin, David S.
Author_Institution :
Nat. Renewable Energy Lab., Golden, CO, USA
fYear :
2012
fDate :
3-8 June 2012
Abstract :
Using Sentaurus Device Software, we analyze how bulk and interface recombination affect time-resolved photoluminescence (TRPL) decays in CdTe solar cells. This modeling analysis could improve the interpretation of TRPL data and increase the possibility of rapid defect characterization in thin-film solar cells. By illuminating the samples with photons of two different wavelengths, we try to deduce the spatial origin of the dominant recombination loss. Shorter-wavelength photons will be more affected by the interface recombination and drift compared to the longer ones. Using the two-wavelength TRPL characterization method, it may be possible to determine whether a specific change in deposition process has affected the properties of interface or the bulk of the absorber.
Keywords :
II-VI semiconductors; cadmium compounds; ion recombination; numerical analysis; photoluminescence; semiconductor thin films; solar cells; CdTe; Sentaurus device software; TRPL decays; deposition process; dominant recombination loss; interface recombination; numerical simulation analysis; rapid defect characterization; shorter-wavelength photons; solar cells; thin-film solar cells; time resolved photoluminescence decay; two-wavelength TRPL characterization method; Charge carrier lifetime; Charge carrier processes; Lighting; Numerical models; Semiconductor process modeling; Spontaneous emission; Wavelength measurement; CdTe; carrier lifetime; interface recombination; numerical simulations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
Conference_Location :
Austin, TX
ISSN :
0160-8371
Print_ISBN :
978-1-4673-0064-3
Type :
conf
DOI :
10.1109/PVSC.2012.6317736
Filename :
6317736
Link To Document :
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