Title :
Calibration residual error propagation analysis using conformal mapping
Author :
Lenk, Friedrich ; Doerner, Ralf ; Rumiantsev, Andrej ; Rudolph, Matthias
Author_Institution :
Hochschule Lausitz (FH), Senftenberg, Germany
Abstract :
In this paper a new method is introduced for analyzing the error propagation when calibrating a vector network analyzer (VNA) with non-ideal calibration elements (“standards”). The underlying equations are perceived as a conformal mapping from the calibration element plane to the calculated S-parameter. With this approach a deep insight of the error propagation is possible. The method can be applied to other measurement problems to evaluate complex uncertainties, as long as the mathematical relationship between measurement data and calculated values forms a linear fractional transformation.
Keywords :
S-parameters; calibration; conformal mapping; network analysers; S-parameter; calibration residual error propagation analysis; complex uncertainty; conformal mapping; linear fractional transformation; mathematical relationship; measurement data; measurement problem; nonideal calibration element plane; vector network analyzer; Calibration; Conformal mapping; Mathematical model; Measurement uncertainty; Scattering parameters; Shape; Uncertainty; Calibration; conformal mapping; error analysis; measurement uncertainty; scattering parameters;
Conference_Titel :
Microwave Measurement Conference (ARFTG), 2011 77th ARFTG
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-61284-959-1
Electronic_ISBN :
978-1-61284-960-7
DOI :
10.1109/ARFTG77.2011.6034551