• DocumentCode
    3515636
  • Title

    Phase change and electrical properties of thin films BaTiO3 system made by RF/DC magnetron sputtering

  • Author

    Song, Min-Jong ; Park, Choon-Bae ; Kim, Tae Wan

  • Author_Institution
    Kwangju Health Coll., South Korea
  • Volume
    2
  • fYear
    1997
  • fDate
    25 -30 May 1997
  • Firstpage
    1030
  • Abstract
    Thin films of the BaTiO3 system were prepared by radio frequency (RF)/DC magnetron sputtering method. We have investigated crystal structure, surface morphology and PTCR (positive-temperature coefficient of resistance) characteristics of the specimen depending on second heat-treatment temperatures. Second heat treatments of the specimen were performed in the temperature range of 400 to 1350°C. X-ray diffraction patterns of BaTiO3 thin films show that the specimen heat treated below 600°C is an amorphous phase and the one heat treated above 1100°C forms a crystal. In the specimen heat-treated at 1300°C, the lattice constant ratio c/a is 1.188. A scanning electron microscope (SEM) image of BaTiO3 thin films shows that the specimen heat treated in between 900 and 1100°C shows grain growth. At 1100°C, the specimen stops grain-growing and becomes a crystal. The resistivity-temperature characteristic of the specimen depends on the doping concentrations of Mn. A resistivity ratio between the value at room temperature and the one above Curie temperature is 104 for pure BaTiO3 thin films and 105 for BaTiO3:0.127 mol% MnO
  • Keywords
    X-ray diffraction; barium compounds; crystallisation; electrical resistivity; ferroelectric thin films; ferroelectric transitions; grain growth; heat treatment; scanning electron microscopy; sputter deposition; sputtered coatings; surface structure; 400 to 1350 C; BaTiO3; BaTiO3 thin film system; BaTiO3:Mn; Mn doping concentrations; PTCR characteristics; RF/DC magnetron sputtering; SEM image; X-ray diffraction patterns; amorphous phase; crystal structure; crystalline phase; electrical properties; grain growth; phase change; positive-temperature coefficient of resistance; resistivity-temperature characteristics; scanning electron microscopy; second heat-treatment temperatures; surface morphology; Amorphous magnetic materials; Electric resistance; Radio frequency; Scanning electron microscopy; Sputtering; Surface morphology; Surface resistance; Surface treatment; Temperature dependence; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 1997., Proceedings of the 5th International Conference on
  • Conference_Location
    Seoul
  • Print_ISBN
    0-7803-2651-2
  • Type

    conf

  • DOI
    10.1109/ICPADM.1997.616622
  • Filename
    616622