• DocumentCode
    3515698
  • Title

    Reliability of die attached AlN-DBC module using Zn-Sn high temperature lead-free solders

  • Author

    Kim, Seonjun ; Kim, Keun-Soo ; Izuta, Goro ; Suganuma, Katsuaki

  • Author_Institution
    Inst. of Sci. & Ind. Res., Osaka Univ., Osaka
  • fYear
    2008
  • fDate
    1-4 Sept. 2008
  • Firstpage
    411
  • Lastpage
    416
  • Abstract
    Interfacial reaction and reliability of Si die attached joints with Zn-xSn (chi= 20, 30, 40 wt%) were investigated, and Pb-5wt%Sn, and Au-20wt% were compared as a typical high temperature solder alloy. The joining strength of Cu/solder/Cu joints was investigated using the as soldered joints and thermal cycled joints up to 2000 cycles. At the interface with Si die coated with Au/TiN thin layers, the TiN layer did not react with the solder and worked as a good protective layer. At the interface with Cu, for Zn-Sn solders, CuZn5 and Cu5Zn8 IMC layers was confirmed. Au-20Sn and Pb-5Sn solder forms zeta-Au5Sn and Cu3Sn IMC layers at the interface with Cu, respectively. For improving the joint reliability, TiN layer was proposed as a protective layer and was applied to the DBC substrates. For the die attached joints on DBC substrates coated with Au/TiN thin layers, no fatigue crack has been found until 1000 cycles of thermal cycling test. The joining strength of the Cu/solder/Cu joints with Zn-Sn solder was about 30~34 MPa, which was higher than that of Pb-5Sn solder (26.2 MPa). For the thermal cycled Cu/solder/Cu joints up to 2000cycles, Zn-Sn solder also shows the higher joining strength than that of Pb-5Sn solder.
  • Keywords
    aluminium compounds; copper; mechanical strength; reliability; solders; AlN-Cu; ZnSn; aluminum nitride-direct bonded copper module; die attached joints; high temperature lead-free solders; interfacial reaction; joining strength; reliability; Environmentally friendly manufacturing techniques; Fatigue; Gold; Lead; Protection; Silicon alloys; Temperature; Testing; Tin; Zinc;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics System-Integration Technology Conference, 2008. ESTC 2008. 2nd
  • Conference_Location
    Greenwich
  • Print_ISBN
    978-1-4244-2813-7
  • Electronic_ISBN
    978-1-4244-2814-4
  • Type

    conf

  • DOI
    10.1109/ESTC.2008.4684383
  • Filename
    4684383