DocumentCode
351570
Title
Frequency jump characteristics versus temperature changes in AT cut bar oscillators
Author
NAKAZAWA, Mitsuo ; Yamamoto, Fumiaki ; Imari, Tsuyoshi
Author_Institution
Shinshu Univ., Nagano, Japan
Volume
1
fYear
1999
fDate
1999
Firstpage
347
Abstract
An analysis of frequency jump and series arm resistance for an AT-cut bar oscillator taking electrode film thicknesses into account was conducted using the electric equivalent circuit model. To test it frequency and resistance characteristics versus temperature changes in AT-cut bar oscillators and resonators were measured taking electrode film thicknesses into account
Keywords
characteristics measurement; crystal oscillators; electric resistance measurement; electron device testing; frequency measurement; AT- cut bar oscillators; AT-cut bar oscillator; electric equivalent circuit model; electrode film thicknesses; frequency jump characteristics; resistance characteristics; series arm resistance; temperature changes; Circuit testing; Conductive films; Electric resistance; Electrical resistance measurement; Electrodes; Equivalent circuits; Frequency measurement; Oscillators; Temperature; Thickness measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency and Time Forum, 1999 and the IEEE International Frequency Control Symposium, 1999., Proceedings of the 1999 Joint Meeting of the European
Conference_Location
Besancon
ISSN
1075-6787
Print_ISBN
0-7803-5400-1
Type
conf
DOI
10.1109/FREQ.1999.840778
Filename
840778
Link To Document