• DocumentCode
    3515702
  • Title

    Development of a high-pressure CdS sputtering process for improved efficiency in CIGS-based photovoltaic devices

  • Author

    Mushrush, Melissa ; Bryden, Todd ; Feist, Rebekah ; Rozeveld, Steve ; Mitchell, Gary ; Fenton, Jeffrey

  • Author_Institution
    Dow Chem. Co., Midland, MI, USA
  • fYear
    2012
  • fDate
    3-8 June 2012
  • Abstract
    A new sputtered process for cadmium sulfide (CdS) has been developed that boosted efficiency of a PV device baseline (with single-stage, coevaporated CIGS) by ~ 2.7% (absolute) to an average of ~10%. The process is highly scalable to a roll-to-roll environment, with the maximum efficiency effect occurring at 0.1 mbar (~75 mTorr) sputtering pressure. The efficiency improvement is thought to be due to two main factors: composition and defects. The CdS film deposited at high pressure (HP) contains more oxygen (primarily as CdO) than one deposited at typical pressures, with oxygen content higher towards the CdS-CIGS interface. The HP process produces an interface with less CdS-CIGS intermixing, which results in a junction with ~ 5x fewer defects as measured by admittance spectroscopy. The performance improvement due to HP CdS occurs even with a very thin CdS layer (<;15 nm), thus greatly reducing the total amount of cadmium contained in the cells.
  • Keywords
    cadmium compounds; solar cells; spectroscopy; sputtered coatings; sputtering; sulphur compounds; CIGS-based photovoltaic devices; CdS; HP process; PV device baseline; admittance spectroscopy; coevaporated CIGS; high-pressure cadmium sulfide sputtering process; intermixing; photovoltaic cells; pressure 0.1 mbar; roll-to-roll environment; sputtered process; sputtering pressure; Admittance; Chemicals; Films; Junctions; Photovoltaic cells; Spectroscopy; Sputtering; cadmium compounds; copper compounds; indium compounds; photovoltaic cells; semiconductor devices; sputtering; thin film devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4673-0064-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2012.6317746
  • Filename
    6317746