DocumentCode :
3515851
Title :
Adapter evaluation using three-adapter technique with ‘Thru-Line’ two-tier calibration in one-port measurements
Author :
Kim, Jeong-Hwan ; Kang, Jin-Seob ; Kwon, Jae-Yong ; Kim, Dae-Chan
Author_Institution :
Center for Electromagn. Wave, Korea Res. Inst. of Stand. & Sci. (KRISS), Daejeon, South Korea
fYear :
2011
fDate :
10-10 June 2011
Firstpage :
1
Lastpage :
7
Abstract :
This paper presents a method using a two-tier calibration with `Thru-Line´ for evaluating the S-parameters of adapters based on three-adapter technique. It uses a one-port VNA (Vector Network Analyzer) to avoid cable movements with `OSL´ (Open-Short-Load) calibration standards, which are widely used for one-port measurements, being used at the first and second calibrations. Formulas are also derived for estimating the uncertainties of the S-parameters of adaptors using the proposed method.
Keywords :
S-parameters; calibration; measurement uncertainty; microwave measurement; network analysers; OSL; S-parameters; VNA; adapter evaluation; one-port measurements; open-short-load; three-adapter technique; two-tier calibration; uncertainity estimation; vector network analyzer; Calibration; Equations; Frequency measurement; Mathematical model; Reflection; Scattering parameters; Standards;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Measurement Conference (ARFTG), 2011 77th ARFTG
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-61284-959-1
Electronic_ISBN :
978-1-61284-960-7
Type :
conf
DOI :
10.1109/ARFTG77.2011.6034568
Filename :
6034568
Link To Document :
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