• DocumentCode
    3515979
  • Title

    Application of multimode TRL technique for accurate balun characterization and estimation of its impact on measurement of differential devices

  • Author

    Issakov, Vadim ; Wojnowski, Maciej ; Sommer, Grit

  • Author_Institution
    Infineon Technol. AG, Neubiberg, Germany
  • fYear
    2011
  • fDate
    10-10 June 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Direct characterization of differential components requires multiport equipment, which is not always available. Thus, it is a common practice to attach balanced-unbalanced (balun) circuits to convert between single-ended and differential signals and perform the measurement using a lower cost two-port vector network analyzer (VNA) or a spectrum analyzer. However, removing the impact of baluns is a challenge. The Insertion Loss technique is commonly applied for two-port measurements of active differential devices to remove the impact of the baluns. In this work we apply the multimode TRL technique for accurate characterization of balun´s S-parameters. We apply the obtained characteristics to provide insight into the impact of balun´s and device under test (DUT) properties on the de-embedding accuracy when the Insertion Loss method is used to characterize active differential devices. The error estimation approach has been verified for a differential Low-Noise Amplifier (LNA) at 24 GHz realized in SiGe:C technology. S-parameters of the LNA have been measured directly using a four-port VNA and compared with those obtained from a two-port measurement implementing the Insertion Loss de-embedding technique.
  • Keywords
    S-parameters; baluns; error analysis; network analysers; production testing; spectral analysers; S-parameter; accurate balun characterization; active differential device measurement; balanced-unbalanced circuit; balun S-parameter; de-embedding accuracy; device under test; differential component; differential low noise amplifier; differential signal; error estimation approach; four-port VNA; frequency 24 GHz; insertion loss de-embedding technique; multimode TRL technique; multiport equipment; spectrum analyzer; two-port measurement; two-port vector network analyzer; Calibration; Gain; Impedance matching; Insertion loss; Loss measurement; Measurement uncertainty; Scattering parameters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Measurement Conference (ARFTG), 2011 77th ARFTG
  • Conference_Location
    Baltimore, MD
  • Print_ISBN
    978-1-61284-959-1
  • Electronic_ISBN
    978-1-61284-960-7
  • Type

    conf

  • DOI
    10.1109/ARFTG77.2011.6034574
  • Filename
    6034574