DocumentCode
3516008
Title
Analyses of RF impedance analyzer and LCR meter readout noise
Author
Liu, Xin Meng ; Huang, Hui ; Xu, Hui
Author_Institution
Nat. Inst. of Metrol., Beijing, China
fYear
2011
fDate
10-10 June 2011
Firstpage
1
Lastpage
3
Abstract
Readout noise of RF impedance analyzer and LCR meter are observed and analyzed with narrow bandwidth noise theory. The difference between theory analysis and actual measurement results is shown. The effect of impedance measurement format on noise is discussed at last.
Keywords
electric impedance measurement; electric noise measurement; LCR meter readout noise; RF impedance analyzer; impedance measurement format; narrow bandwidth noise theory; Admittance; Admittance measurement; Equations; Impedance; Impedance measurement; Noise; Radio frequency;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Measurement Conference (ARFTG), 2011 77th ARFTG
Conference_Location
Baltimore, MD
Print_ISBN
978-1-61284-959-1
Electronic_ISBN
978-1-61284-960-7
Type
conf
DOI
10.1109/ARFTG77.2011.6034577
Filename
6034577
Link To Document