• DocumentCode
    3516453
  • Title

    The fabrication of gas sensor using the resonant frequency and admittance of quartz crystal analyzer

  • Author

    Kim, Jung-Myoung ; Kang, Hyen-Wook ; Kwon, Young-Soo

  • Author_Institution
    Dept. of Electr. Eng., Dong-A Univ., Pusan, South Korea
  • Volume
    2
  • fYear
    1997
  • fDate
    25 -30 May 1997
  • Firstpage
    1051
  • Abstract
    The adsorption and desorption behavior of organic vapours for polymeric sensitive LB film was investigated using the resonant frequency and resistance method of a quartz crystal microbalance. A new method was used to analyze the response mechanism between organic vapours and polymeric sensitive LB films. When the organic vapours were adsorbed into sensitive LB films, the rheological changes in LB films were observed by the quartz microbalance resonant method. To investigate the characteristics of organic vapours, a resonant frequency-resonant resistance (F-R) diagram was used. The quantitative information about organic vapours adsorbed and quantitative change of sensitive LB films can be obtained. In experimental results, the response of organic vapours can be separated into two types; surface adsorption and penetration into sensitive LB films. The response mechanism between organic vapours and sensitive LB films can be obtained from the F-R diagram
  • Keywords
    Langmuir-Blodgett films; adsorption; crystal resonators; desorption; gas sensors; microbalances; polymer films; quartz; SiO2; admittance; adsorption behavior; desorption behavior; gas sensor; microbalance; organic vapours; polymeric sensitive LB film; quartz crystal analyzer; resonant frequency; resonant frequency-resonant resistance diagram; response mechanism; rheological changes; surface adsorption; Admittance; Electric resistance; Electrical resistance measurement; Fabrication; Gas detectors; Polymer films; Resonance; Resonant frequency; Rheology; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 1997., Proceedings of the 5th International Conference on
  • Conference_Location
    Seoul
  • Print_ISBN
    0-7803-2651-2
  • Type

    conf

  • DOI
    10.1109/ICPADM.1997.616627
  • Filename
    616627