Title :
HOLM 2011 Table of contents
Abstract :
The following topics are dealt with: arc interruption; young investigator award; fundamentals; fretting; relays; arcing; arc fault; electrical safety; MEMS; microcontact; connector degradation; high power sliding; and contact resistance.
Keywords :
arcs (electric); contact resistance; electric connectors; electrical contacts; micromechanical devices; relays; wear; MEMS; arc fault; arc interruption; arcing; connector degradation; contact resistance; electrical safety; fretting; high power sliding; microcontact; relays;
Conference_Titel :
Electrical Contacts (Holm), 2011 IEEE 57th Holm Conference on
Conference_Location :
Minneapolis, MN
Print_ISBN :
978-1-61284-650-7
DOI :
10.1109/HOLM.2011.6034766
