• DocumentCode
    3516498
  • Title

    An energy efficient circuit level technique to protect register file from MBUs and SETs in embedded processors

  • Author

    Fazeli, M. ; Namazi, A. ; Miremadi, S.G.

  • Author_Institution
    Dept. of Comput. Eng., Sharif Univ. of Technol., Tehran, Iran
  • fYear
    2009
  • fDate
    June 29 2009-July 2 2009
  • Firstpage
    195
  • Lastpage
    204
  • Abstract
    This paper presents a circuit level soft error-tolerant-technique, called RRC (robust register caching), for the register file of embedded processors. The basic idea behind the RRC is to effectively cache the most vulnerable registers in a small highly robust register cache built by circuit level SEU and SET protected memory cells. To decide which cache entry should be replaced, the average number of read operations during a register ACE time is used as a criterion to judge. In fact, the victim cache entry is one which has the maximum read count. To minimize the power overhead of the RRC, the clock gating technique is efficiently exploited for the main register file resulting in significantly low power consumption. The RRC is able to protect the register file not only against single bit upsets (SBUs) but also against multiple bit upsets (MBUs) and single event transients (SETs). The RRC is experimentally evaluated using the LEON processor. The experimental results show that, if the cache size is selected properly, the architectural vulnerability factor (AVF) of the register file becomes about 1% while it imposes low power, area and performance overheads to the processor.
  • Keywords
    cache storage; circuit reliability; embedded systems; fault tolerance; low-power electronics; microprocessor chips; AVF; LEON processor; MBU; RRC; SET; architectural vulnerability factor; clock gating technique; embedded processor reliability; energy-efficient circuit level soft error-tolerant-technique; low-power consumption; memory cell protection; multiple bit upset; performance overhead; power overhead minimization; read operation; register file protection; robust register caching; single event transient; victim cache entry; Circuits; Embedded computing; Energy consumption; Energy efficiency; Error correction; Error correction codes; Protection; Registers; Robustness; Single event upset;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dependable Systems & Networks, 2009. DSN '09. IEEE/IFIP International Conference on
  • Conference_Location
    Lisbon
  • Print_ISBN
    978-1-4244-4422-9
  • Electronic_ISBN
    978-1-4244-4421-2
  • Type

    conf

  • DOI
    10.1109/DSN.2009.5270337
  • Filename
    5270337