• DocumentCode
    3516899
  • Title

    Investigating the movement of chip components during reflow soldering

  • Author

    Krammer, Olivér ; Radvanszki, Zoltán ; Illyefalvi-Vité, Zsolt

  • Author_Institution
    Dept. of Electron. Technol., Budapest Univ. of Technol. & Econ., Budapest
  • fYear
    2008
  • fDate
    1-4 Sept. 2008
  • Firstpage
    851
  • Lastpage
    856
  • Abstract
    The self-alignment of chip resistors has been investigated by experiments and by simulations as well. By evaluating the results it can be said, that the self-alignment of chip resistors occurred even in the case of 500 mum x direction (lateral) misplacement. Another observation can be stated on the base of the experiment, that the SM (surface mounted) chip resistors moved less distance in y direction than in x direction. The average distance which is traveled by the component in x direction is 249 mum, while the average distance in y direction is 75 mum. It was proposed on the base of our physical model that if metallization presents on the sidewalls of the component then the y direction self-alignment of components can be improved. The proposal was confirmed by simulations and by real experiments as well. Surface mounted chip resistors and chip capacitors were compared from the viewpoint of y direction self-alignment. The chip capacitor has a shape of metallization nearly the same as the proposed one. On the base of the results it can be stated that the y direction self-alignment of chip capacitors is significantly better.
  • Keywords
    capacitors; printed circuit manufacture; reflow soldering; resistors; surface mount technology; chip capacitors; chip component movement; distance 249 mum; distance 75 mum; printed circuit manufacture; reflow soldering; self-alignment; surface mounted chip resistors; Assembly; Capacitors; Metallization; Proposals; Reflow soldering; Resistors; Samarium; Shape; Solid modeling; Surface tension;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics System-Integration Technology Conference, 2008. ESTC 2008. 2nd
  • Conference_Location
    Greenwich
  • Print_ISBN
    978-1-4244-2813-7
  • Electronic_ISBN
    978-1-4244-2814-4
  • Type

    conf

  • DOI
    10.1109/ESTC.2008.4684463
  • Filename
    4684463