Title :
Fuzzy MCDM approach for IC company´s strategy in the semiconductor industry
Author :
Lee, Zon-Yau ; Tzeng, Gwo-Hshiung ; Yu, Hsiao-Cheng
Author_Institution :
Inst. of Technol. Manage., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Abstract :
In this paper, the impacts of global competition on the IC corporate strategies for the semiconductor industries are studied. This research seeks to blend strategic competition with global development by addressing challenges for deterministic attitudes. It also examines critical environmental factors, technological systems and governmental policy on IC companies in the changes of the semiconductor industries. The need for a new strategy paradigm for IC companies, which comes out of new trends of the global competition, are also examined. The impacts of IC corporate strategy for the semiconductor industry are discussed and a hierarchical fuzzy multicriteria decision-making (fuzzy MCDM) method for evaluating the propagating IC companies´ strategies is proposed. Finally, an example is provided in order to show the practicability and usefulness of this method. From the results of practical applications in evaluating the IC corporate strategies, the proposed method is appropriate and appears to be ideal for a fuzzy environment
Keywords :
decision theory; electronics industry; fuzzy logic; management; operations research; IC company strategy; corporate strategy; deterministic attitudes; environmental factors; global development; governmental policy; hierarchical fuzzy multicriteria decision-making method; semiconductor industry; strategic competition; strategy paradigm; technological systems; Application specific integrated circuits; Decision making; Electronics industry; Environmental factors; Position measurement; Process planning; Resource management; Strategic planning; Technological innovation; Technology management;
Conference_Titel :
Management of Engineering and Technology, 2001. PICMET '01. Portland International Conference on
Conference_Location :
Portland, OR
Print_ISBN :
1-890843-06-7
DOI :
10.1109/PICMET.2001.952425