DocumentCode
3516956
Title
Discrete Analysis of Gold Surface Asperities Deformation under Spherical Nano-Indentation Towards Electrical Contact Resistance Calculation
Author
Arrazat, Brice ; Duvivier, Pierre-Yves ; Mandrillon, Vincent ; Inal, Karim
Author_Institution
Centre Microelectron. de Provence Georges Charpak, Ecole Nat. Super. des Mines de St.-Etienne, Gardanne, France
fYear
2011
fDate
11-14 Sept. 2011
Firstpage
1
Lastpage
8
Abstract
MEMS ohmic switches have demonstrated interesting performances due in part to their low contact resistance which depends on multiple contributions, one amongst them is the roughness of the contact area. In fact, the contact area is composed by clusters asperities that have different sizes, heights and curvature radii. In this work, we investigate the discrete mechanical deformation of asperities at the nano-scale, in the micro-switch pressure range. Loads from 250 μN up to 2 mN are applied by a nano-indenter with a spherical diamond tip (48.5 μm curvature radius). The resulting contact areas are investigated by AFM topography measurements and treated by digital image processing. As a result for each applied loads, the asperities in plastic deformation mode are sorted and used to determine a value of "surface hardness", coherent with the hardness measured by Berkovich nano-indentation. Finally, the asperities identified in plastic deformation mode are used as inputs for the calculation of the electrical contact resistances of equivalent micro-switches.
Keywords
atomic force microscopy; contact resistance; deformation; discrete systems; gold; microswitches; nanoindentation; ohmic contacts; surface topography measurement; AFM topography measurements; Au; MEMS ohmic switches; digital image processing; discrete analysis; discrete mechanical deformation; electrical contact resistance calculation; gold surface asperities deformation; microswitch pressure range; spherical nano-indentation; Contacts; Gold; Manganese; Plastics; Rough surfaces; Surface roughness; Surface treatment;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Contacts (Holm), 2011 IEEE 57th Holm Conference on
Conference_Location
Minneapolis, MN
ISSN
1062-6808
Print_ISBN
978-1-61284-650-7
Type
conf
DOI
10.1109/HOLM.2011.6034798
Filename
6034798
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