DocumentCode
3517100
Title
Effect of shunt resistance on the performance of mc-Silicon solar cells: a combined electro-optical and thermal investigation
Author
Barbato, M. ; Meneghini, M. ; Giliberto, V. ; Giaffreda, D. ; Magnone, P. ; De Rose, R. ; Fiegna, C. ; Meneghesso, G.
Author_Institution
Dept. of Inf. Eng., Univ. of Padova, Padova, Italy
fYear
2012
fDate
3-8 June 2012
Abstract
In this paper we discuss the effect of shunt resistance on the electro-optical characteristics of multicrystalline silicon (mc-Si) solar cells at different illumination levels. The analysis is based on combined electro-optical characterization and thermographic measurements of solar cells with similar efficiencies, but with different shunt resistance levels. In order to understand how the shunt resistance can affect the performance of mc-Si solar cells, a special setup for J-V characterization at several illumination levels was developed. Results indicate that (i) a low shunt resistance is strongly correlated to the presence of hot spots, which can be identified by means of infrared thermography; (ii) solar cells with different shunt resistance levels can show significantly different fill factors and efficiencies, particularly at low irradiation levels. This can strongly influence the reliability of modules at low illumination conditions; (iii) the electrical characteristics of mc-Si solar cells can be modeled with good results, by considering the equivalent two-diode electrical model and solving it by a circuit simulator like SPICE.
Keywords
electric resistance; electro-optical devices; equivalent circuits; photoelectricity; semiconductor diodes; silicon; solar cells; thermal analysis; Si; electrical characteristics; electro-optical characteristics; electro-optical investigation; equivalent two diode electrical model; fill factors; illumination level; irradiation level; multicrystalline solar cells; shunt resistance; thermal investigation; thermographic measurement; Conferences; Lighting; Photovoltaic cells; Photovoltaic systems; Resistance; Sun; LED solar simulator; dark I-V characterization; mc-Si solar cell; modeling; thermographic pulsed characterization;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
Conference_Location
Austin, TX
ISSN
0160-8371
Print_ISBN
978-1-4673-0064-3
Type
conf
DOI
10.1109/PVSC.2012.6317827
Filename
6317827
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