Concurrent Error Detection for FSMs Designed for Implementation with Embedded Memory Blocks of FPGAs

We propose a cost-efficient concurrent error detection (CED) scheme for FSMs designed for implementation with embedded memory blocks(EMBs) available in today´s SRAM-based FPGAs. The scheme is proven to detect each permanent or transient fault associated with a single input or output of any component of the circuit that results in its incorrect state or output. The experimental results obtained using our proprietary FSM synthesis tool show that despite the heterogeneous structure of the proposed CED scheme, the overhead is very low. For the examined benchmark circuits, the overhead in terms of extra EMBs is in the range of 5.0% to 56.3%, with an average value of 26.5% This compares favorably with the earlier proposed solutions applicable to conventional FSM designs intended for an implementation with gates and flip-flops for which an overhead exceeding 100% is quite typical.