• DocumentCode
    3517270
  • Title

    Saboteur-Based Fault Injection for Quantum Circuits Fault Tolerance Assessment

  • Author

    Boncalo, Oana ; Udrescu, Mihai ; Prodan, Lucian ; Vladutiu, Mircea ; Amaricai, Alexandru

  • Author_Institution
    Comput. Sci. & Eng. Dept., "Politehnica" Univ. of Timisoara, Timisoara, Romania
  • fYear
    2007
  • fDate
    29-31 Aug. 2007
  • Firstpage
    634
  • Lastpage
    640
  • Abstract
    The importance of reliability and fault tolerance is paramount in quantum computation. This paper proposes a Fault Tolerance Algorithms and Methodologies (FTAM) assessment technique for quantum circuits, by adopting the saboteur-based Simulated Fault Injection methodology from classical computation. By drawing the inspiration from classical computation, the HDLs were employed for performing fault injection, due to their capacity of behavioral and structural circuit description, including hierarchical features. The cornerstone of this approach is the adaptation of the available quantum computation error models (with the quantum computing features and constraints) to the classical, HDL framework of the simulated fault injection techniques. The experimental simulated fault injection campaign results are consistent with the analytical assessments -from a qualitative point of view - but at the same time they provide a much realistic description.
  • Keywords
    fault simulation; logic testing; quantum gates; reliability; fault tolerance algorithms; fault tolerance methodologies; quantum circuits fault tolerance assessment; quantum computation; saboteur-based fault injection; Circuit faults; Circuit simulation; Computational modeling; Computer errors; Computer simulation; Error correction codes; Fault tolerance; Fault tolerant systems; Hardware design languages; Quantum computing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Digital System Design Architectures, Methods and Tools, 2007. DSD 2007. 10th Euromicro Conference on
  • Conference_Location
    Lubeck
  • Print_ISBN
    978-0-7695-2978-3
  • Type

    conf

  • DOI
    10.1109/DSD.2007.4341534
  • Filename
    4341534